Welcome to IPFA 2019
Winner for Best Paper (Reliability) :
Title : Understanding lifetime prediction methodology for In0.53Ga0.47As nFETs under Positive Bias Temperature Instability (PBTI) condition
Authors : Zhigang Ji, Xiong Zhang and Jianfu Zhang
Main Affiliation : Liverpool John Moores University, UK.
Winner for Best Paper (FA) :
Title :Fault Localization Using Dynamic Optical-beam Induced Current Variation Mapping
Authors : Man Hon Thor, Szu Huat Goh, Boonlian Yeoh, Hao Hu, Yin Hong Chan and Lin Zhao
Main Affiliation : Globalfoundries Singapore
Prasad Chaparala is the Director of Reliability Engineering at Amazon Lab126 in Sunnyvale, California. He is responsible for reliability engineering of a broad range of consumer electronic devices such as Echo smart speakers, Kindle e-readers, Fire tablets, and Fire TV products. Prior to this, he was the Vice President of Product and Reliability Engineering at…
Shimeng Yu is an associate professor of electrical and computer engineering at the Georgia Institute of Technology in Atlanta, Georgia. He received the B.S. degree in microelectronics from Peking University, Beijing, China in 2009, and the M.S. degree and Ph.D. degree in electrical engineering from Stanford University, Stanford, California, in 2011 and in 2013, respectively….