Art of Failure Analysis
Photography plays an essential role in physical failure analysis of electronic devices and components. It enables us to study the failures at microscale or nanoscale levels and the images obtained can provide information to understand the failure mechanisms. In this competition, participants of the IPFA conference are invited to submit their best images to share their research through visual means. The images can be obtained from various failure analysis instruments such as SEM, TEM, CT, OM, FIB etc.
The image must not contain any embedded information and must be in its original resolution. The image size shall not exceed 10 MB. A suitable title/name and a short description (not exceeding 50 words) must accompany the image submitted.
1st Prize: S$ 300 cash
2nd Prize: S$ 200 cash
3rd Prize: S$ 100 cash