IPFA 2018 Best Paper

IPFA 2018 Best Paper in FA:

Characterization of Bandgap Engineering on Operative Transistor Devices by Spectral Photon Emission

by Anne Beyreuther1, Ivo Vogt1, Tomonori Nakamura2, Gerhard G. Fischer3, Babak Motamedi4 and Christian Boit1

1TU Berlin, Germany, 2Hamamatsu Photonics KK, Japan, 3IHP – Innovations for High Performance Microelectronics, Germany, 4Qualcomm Incorporated, USA

IPFA 2018 Best Paper in Reliability:

Self-heating Induced Variability and Reliability in Nanosheet-FETs Based SRAM”

by Wangyong Chen1, Linlin Cai1, Kunliang Wang1, Xing Zhang1,2, Xiaoyan Liu1and Gang Du1

1Institute of Microelectronics, Peking University, China, 2National Key Laboratory of Science and Technology on  Micro/Nano Fabrication, China

IPFA 2018 Best Poster Paper in FA:

Plan-View to Cross-Section Conversion Work-Flow for Defect Analysis

Zdenek Kral and Trevan Landin

Thermo Fisher Scientific, USA

IPFA 2018 Best Poster Paper in Reliability:

Failure Analysis of a Degraded 1.2 kV SiC MOSFET after Short Circuit at High Temperature

Paula Diaz Reigosa, Francesco Iannuzzo and Lorenzo Ceccarelli

Aalborg University, Denmark