Dr. Philippe Perdu
Invited Talk Topic: Failure Analysis on Space Electronics: Best Practices, Challenges and Trends
Philippe Perdu is Senior Expert in microelectronics at CNES. He has led the VLSI Failure Analysis CNES laboratory since 1988. His main activity is to develop techniques and to adapt tools for electronic components dedicated to space applications. It mostly concerns FA process (defect localization).
His other activities are to provide support to space project (failure analysis at system / board / component level), to drive expertise roadmap (tooling) and to setup R&D programs related to VLSI expertise and reliability, to coach, train and supervise teams dedicated to these activities.
He holds an Electronic Specialty MS, Ph.D. and HDR (academic research supervisor). He has authored or co-authored more than 239 papers and 25 patents.
He chaired CCT MCE, a corporate network on electronic components and MEMS (2007 to 2011) and ANADEF, the French FA society (former president from 2005 to 2009, now secretary). He has been board member of EDFAS (Electron Device Failure Analysis Society), Organizing Committee member of ISTFA from 2005 to 2014 (Technical Chair in 2010, General Chair in 2012). He is still EUFANET (European Failure Analysis NETwork) board member, Associate Editor of EDFA Magazine, Editorial Advisory Board member of Miroelectronics Reliability and Steering Committee member of ESREF (Vice-Chair in 2015). He has participated in ESREF, ISTFA, IRPS, IPFA conferences as author, committee member and session chair.
He his doing research on optical testing (static and dynamic laser stimulation, laser probing and emission microscopy) and defect localization in 3D devices.
He is deeply involved in CNES / NTU cooperation and Adjunct Senior Principal Research Scientist at Temasek laboratories @ NTU since 2016 and Intraspec Technologies Scientific Advisor since 2011.