Professor Xing Wu

Prof. Xing Wu received her bachelor’s degree in Electronic Engineering from Xi’an Jiaotong University (XJTU) China in 2008 and her PhD degree from Nanyang Technological University (NTU) Singapore in 2012 (supervisor: Prof. Kinleong Pey). Then, she worked at the Singapore University of Design and Technology (SUTD) and Southeast University (SEU). She is currently a professor at East China Normal University (ECNU) China. She has published more than 90 SCI journal papers including Nature Communications, Advanced Materials, and IEEE TED with more than 3000 citations. She holds more than 30 patents.

Invited Talk Topic: ESD failure analysis by using transmission electron microscopy at the atomic scale

Transmission electron microscopy (TEM), with its high spatial resolution and versatile external fields, is undoubtedly a powerful tool for the static characterization and dynamic manipulation of nanomaterials and nanodevices at the atomic scale. The rapid development of thin-film and precision microelectromechanical systems (MEMS) techniques allows the microstructure during ESD to be probed and engineered inside TEM under external stimuli such as electrical and thermal fields at the nanoscale. Here, taking advantage of advanced in situ transmission electron microscopy, we manipulated interfaces of ESD. The progress of the in situ TEM paves the way to future nanodevices.